| @I(D) (A) (Test Condition): | 8.3 |
| @Temp (øC) (Test Condition): | 25 |
| g(fs) Min. (S) Trans. conduct.: | 5.1 |
| @I(D) (A) (Test Condition): | 8.3 |
| @V(DS) (V) (Test Condition): | 25 |
| @Temp (øC): | 100 |
| I(DSS) Max. (A): | 250u |
| t(d)off Max. (s) Off time: | 35n |
| I(DM) Max. (A) Pulsed I(D): | 8.3 |
| V(GS)th (V) (Min): | 2 |
| @I(D) (A) (Test Condition): | 250u |
| @Freq. (Hz) (Test Condition): | 1M |
| g(fs) Max; (S) Trans. conduct;: | 7.6Â |
| @V(DS) (V) (Test Condition): | 100 |
| @V(DS) (V) (Test Condition): | 50 |
| V(GS)th Max. (V): | 4 |
| IDM Max (@25øC Amb): | 48# |
| @V(GS) (V) (Test Condition): | 20 |
| Thermal Resistance Junc-Amb.: | 80 |
| @V(GS) (V) (Test Condition): | 10 |
| td(on) Max (s) On time delay: | 15n |
| Thermal Resistance Junc-Case: | 1.9 |
| Minimum Operating Temp (øC): | -55õ |